By Joe Kelly
That includes important enter from industry-leading businesses and highly-regarded specialists within the box, this first-of-its sort source deals skilled engineers a entire knowing of the complicated themes in RF, SiP (system-in-package), and SoC (system-on-a-chip) creation trying out which are serious to their paintings related to semiconductor units. The e-book covers key dimension strategies for semiconductor gadget trying out and assists engineers in explaining those recommendations to administration to help cut back venture expense, time, and assets. in keeping with real-world adventure and filled with time-saving equations, this in-depth quantity bargains execs sensible info on crucial themes that experience by no means been offered in one reference prior to.
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Additional resources for Advanced Production Testing of RF, SoC, and SiP Devices
3 Built-In Self-Tests While built-in self-tests (BISTs) have been used for many years in digital circuit design and testing, it is in its infancy when applied to RF circuits. The focus of BIST is on transistor-level defects, a level of granularity not traditionally observed by RF test engineers. Through its use, test costs can be reduced by reducing the externally applied signals (requiring less external hardware). This can allow for tremendous possible testing opportunities in multisite testing.
It is important to note that S-parameters are not scalar numbers but vectors; since we are applying voltage waves and observing the device’s response by Tests and Measurements I: Fundamental RF Measurements 23 measuring the reflected or transmitted waves, we have to compare the magnitudes and phase information in the calculations. Therefore, S-parameters can be listed in a magnitude–phase notation or in real–imaginary notation. The more common way is to specify magnitude and phase. In RF and SoC testing, the phase is typically not of importance, and the test engineer concentrates only on the magnitude portion of the measurement.
As mentioned earlier, S-parameters are obtained by calculating the ratios between reflected to incident and transmitted to incident voltage waves. 1 Input Match Probably the most widely used application for S-parameters in SoC testing is to determine the input match of the device. The input match of the device indicates how much of the power that is applied to the device is reflected. Obviously this number should be low because the goal is to get as much of the applied power into the device as possible.